Publication Details

Topic : A Formal Model indicating Inter-relationship of CK Metrics in view of Defect Proneness

Presented by : Faculty : Dr.R.Selvarani
Others :

Other Details : Accepted for publication in the International Journal of computers and Technologies (IJCT) Co-Author, S. Aishwarya. August 2013

Category :

Date : January 7, 2014

Department : BE - Computer Science Engineering

External Link : Not available

PDF File : Not available

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